At GIFA 2015, we were able to make many interesting contacts again. The presentations of our spectrometer for the highly precise metal analysis found great interest among the trade visitors from around the world. In particular, we were pleased about the participation at the BELEC booth of our representatives from India, Mr. Ameya Mandlik and from Japan, Mr. Satoshi Okawa and Mr. Keisuke Okawa.
After this event both took the opportunity to visit the BELEC factory for an advanced service training including an introduction of our latest products.
Thank you for visiting!